2023 Interferogram analysis of X-pinch plasmas with a synthetic dark-field Schlieren image 본문 Author 황용석 Journal Journal of Instrumentation Vol./ Page Volume 18, Issue 11 Year 2023 DOI professor 수정 삭제 검색 목록 이전글Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect 24.07.11 다음글Application of sensitivity patterns to inversion of magnetotelluric field data in Utah for selecting optimal input 24.07.11